Data Structures | Public Types | Data Fields

TestDescription Struct Reference

defines a test [shot] . More...

#include <llcontrol.h>

Data Structures

struct  ARG

Public Types

enum  Mode {
  M_NULL, M_SCM, M_ECS, M_ECM,
  M_SYNC_ECM, M_SYNC_2V, M_SYNC_2VAO32, M_MEASURE_BRIDGE,
  M_SYNC_2VRFM
}

Data Fields

enum TestDescription::Mode mode
struct TestDescription::ARG arg
int iter
 current iteration #
int iterations
 samples to acquire
int decimation
 {0..15} (0 won't do much!)
int overwrite
 NOT append.
const char * outfname
 root name of output file (if output rqd)
int do_work
 do work (like read data in RT)
int clkpos
 1=> clock positive edge
int trpos
 1=> trigger positive edge
int internal_loopback
int min_latency_test
 trim for abs minimum latency
int mask_ints
 optionally mask interrupts
int mask_ints_mask
int ncards
struct Card cards [MAXCARDS]
struct TimingStats * stats_buf [MAXCARDS]
void * work_buf [MAXCARDS]
int channels
int samples
int sample_size
int hb_polling
int update_dacs
char * dac_data_file
char * dac_data
int dac_data_samples
int dac_cursor
int feedback
int feedback_channel
int tlog
const char * tlog_binfile
int sample_offset
int hardware_gate_off
u32 V2_BUFS [8]
int ao32_count
int ao32_ids [MAXAO32]
struct LLC200_INIT * llc200_init
int llc200_init_count
int acq216hs_ch12ch34_bonding

Detailed Description

defines a test [shot] .

Definition at line 135 of file llcontrol.h.

Member Enumeration Documentation

enum TestDescription::Mode
Enumerator:
M_NULL 

null test

M_SCM 

Soft Clock Master.

M_ECS 

External Clock Slave.

M_ECM 

ECM External Clock Master.

M_SYNC_ECM 

ECM, sync AO update.

M_SYNC_2V 

ECM, 2 Vector sync.

M_SYNC_2VAO32 

ECM, 2 Vector sync + AO32 cards.

M_MEASURE_BRIDGE 

measure bridge latency

M_SYNC_2VRFM 

M_SYNC_2V, monitor at remote.

Definition at line 136 of file llcontrol.h.

Field Documentation

int TestDescription::acq216hs_ch12ch34_bonding

Definition at line 202 of file llcontrol.h.

Referenced by main(), and makeChannelMask().

int TestDescription::ao32_count

Definition at line 197 of file llcontrol.h.

Referenced by appEnterLLC_SYNC_2VAO32(), main(), and runSYNC_2VAO32().

int TestDescription::ao32_ids[MAXAO32]

Definition at line 198 of file llcontrol.h.

Referenced by appEnterLLC_SYNC_2VAO32(), and main().

struct TestDescription::ARG TestDescription::arg

Referenced by appEnterLLC_SYNC_2V(), appEnterLLC_SYNC_2VAO32(), appEnterLLC_SYNC_ECM(), do_run(), main(), runTest(), and setDefaults().

struct Card TestDescription::cards[MAXCARDS]

Definition at line 169 of file llcontrol.h.

Referenced by appEnterLLC_SYNC_2V(), appEnterLLC_SYNC_2VAO32(), monitor_handler(), and selectBoards().

int TestDescription::channels

Definition at line 175 of file llcontrol.h.

Referenced by appEnterLLC_SYNC_2V(), appEnterLLC_SYNC_2VAO32(), do_run(), doApplicationWork216(), initPrams(), main(), makeChannelMask(), and setDefaults().

int TestDescription::clkpos

1=> clock positive edge

Definition at line 160 of file llcontrol.h.

Referenced by appEnterLLC_SYNC_2V(), appEnterLLC_SYNC_2VAO32(), appEnterLLC_SYNC_ECM(), main(), runTest(), and setDefaults().

int TestDescription::dac_cursor

Definition at line 184 of file llcontrol.h.

Referenced by td_allocate_dac_data(), and td_get_next_dac_data().

char* TestDescription::dac_data

Definition at line 182 of file llcontrol.h.

Referenced by td_allocate_dac_data(), td_get_next_dac_data(), td_load_dac_data_file(), and td_load_dac_data_impulse().

char* TestDescription::dac_data_file

Definition at line 181 of file llcontrol.h.

Referenced by main(), and td_load_dac_data().

int TestDescription::dac_data_samples

Definition at line 183 of file llcontrol.h.

Referenced by td_allocate_dac_data(), and td_get_next_dac_data().

int TestDescription::decimation

{0..15} (0 won't do much!)

Definition at line 156 of file llcontrol.h.

Referenced by do_run(), main(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), runSYNC_ECM(), and setDefaults().

int TestDescription::do_work

do work (like read data in RT)

Definition at line 159 of file llcontrol.h.

Referenced by do_run(), doPostShotAnalysis(), main(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), and runSYNC_ECM().

int TestDescription::feedback

Definition at line 186 of file llcontrol.h.

Referenced by do_run(), main(), runSYNC_2V(), runSYNC_2VAO32(), and runSYNC_ECM().

int TestDescription::feedback_channel

Definition at line 187 of file llcontrol.h.

Referenced by do_run(), main(), runSYNC_2V(), runSYNC_2VAO32(), and runSYNC_ECM().

int TestDescription::hardware_gate_off

Definition at line 193 of file llcontrol.h.

Referenced by do_run(), main(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), and runSYNC_ECM().

int TestDescription::hb_polling

Definition at line 178 of file llcontrol.h.

Referenced by do_run(), initV2(), main(), runSCM216(), and setDefaults().

int TestDescription::internal_loopback

Definition at line 162 of file llcontrol.h.

Referenced by appEnterLLC_SYNC_2V(), appEnterLLC_SYNC_2VAO32(), appEnterLLC_SYNC_ECM(), main(), runTest(), and setDefaults().

int TestDescription::iter

current iteration #

Definition at line 153 of file llcontrol.h.

Referenced by do_run(), doApplicationWork(), doApplicationWork216(), monitor_handler(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), and runSYNC_ECM().

int TestDescription::iterations

samples to acquire

Definition at line 155 of file llcontrol.h.

Referenced by do_run(), doDmaBufDataOutput(), doWorkBufDataOutput(), dumpTimingStats(), dumpTimingStatsBin(), initWorkBuf(), main(), measureBridgeStats(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), runSYNC_ECM(), runTest(), setDefaults(), and td_dss().

struct LLC200_INIT* TestDescription::llc200_init

Definition at line 200 of file llcontrol.h.

Referenced by initPrams(), loadPramfile(), and setAcq216Parameters().

int TestDescription::llc200_init_count

Definition at line 201 of file llcontrol.h.

Referenced by loadPramfile(), main(), runSCM216(), and setAcq216Parameters().

int TestDescription::mask_ints

optionally mask interrupts

Definition at line 165 of file llcontrol.h.

Referenced by main(), measureBridgeStats(), runTest(), and setDefaults().

int TestDescription::mask_ints_mask

Definition at line 166 of file llcontrol.h.

Referenced by main(), measureBridgeStats(), runTest(), and setDefaults().

int TestDescription::min_latency_test

trim for abs minimum latency

Definition at line 163 of file llcontrol.h.

Referenced by do_run(), main(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), and runSYNC_ECM().

enum TestDescription::Mode TestDescription::mode

Referenced by main(), runTest(), and setDefaults().

int TestDescription::ncards

Definition at line 168 of file llcontrol.h.

Referenced by selectBoards().

const char* TestDescription::outfname

root name of output file (if output rqd)

Definition at line 158 of file llcontrol.h.

Referenced by doPostShotAnalysis(), main(), and make_output_file().

int TestDescription::overwrite

NOT append.

Definition at line 157 of file llcontrol.h.

Referenced by do_run(), doDmaBufDataOutput(), main(), runSCM216(), and setDefaults().

int TestDescription::sample_offset

Definition at line 191 of file llcontrol.h.

Referenced by do_run(), doDmaBufDataOutput(), main(), and runSCM216().

int TestDescription::sample_size

Definition at line 177 of file llcontrol.h.

Referenced by main(), and td_sample_size().

int TestDescription::samples

Definition at line 176 of file llcontrol.h.

Referenced by doApplicationWork216(), doDmaBufDataOutput(), doWorkBufDataOutput(), initWorkBuf(), main(), and setDefaults().

struct TimingStats* TestDescription::stats_buf[MAXCARDS]

Definition at line 171 of file llcontrol.h.

Referenced by do_run(), dumpTimingStats(), dumpTimingStatsBin(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), runSYNC_ECM(), and runTest().

int TestDescription::tlog

Definition at line 189 of file llcontrol.h.

Referenced by do_run(), doPostShotAnalysis(), main(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), runSYNC_ECM(), and runTest().

const char* TestDescription::tlog_binfile

Definition at line 190 of file llcontrol.h.

Referenced by doPostShotAnalysis(), and main().

int TestDescription::trpos

1=> trigger positive edge

Definition at line 161 of file llcontrol.h.

Referenced by appEnterLLC_SYNC_2V(), appEnterLLC_SYNC_2VAO32(), appEnterLLC_SYNC_ECM(), main(), runTest(), and setDefaults().

int TestDescription::update_dacs

Definition at line 180 of file llcontrol.h.

Referenced by do_run(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_ECM(), setDefaults(), and td_load_dac_data().

u32 TestDescription::V2_BUFS[8]

Definition at line 195 of file llcontrol.h.

Referenced by commandModifiers(), initV2(), and initV2Stats().

void* TestDescription::work_buf[MAXCARDS]

Definition at line 173 of file llcontrol.h.

Referenced by doApplicationWork(), doApplicationWork216(), doWorkBufDataOutput(), and initWorkBuf().

The documentation for this struct was generated from the following file:
Generated on Wed Jan 5 2011 for llcontrol by  doxygen 1.7.1